WORLD METROLOGY DAY — 20th MAY 2019 MESSAGE FROM THE BIPM AND BIML DIRECTORS “THE SI — FUNDAMENTALLY BETTER”

Для цитирования:

Milton M., Donnellan А. WORLD METROLOGY DAY — 20th MAY 2019 MESSAGE FROM THE BIPM AND BIML DIRECTORS “THE SI — FUNDAMENTALLY BETTER”. Заводская лаборатория. Диагностика материалов. 2019;85(6):69.

For citation:

Milton M., Donnellan A. WORLD METROLOGY DAY — 20th MAY 2019 MESSAGE FROM THE BIPM AND BIML DIRECTORS “THE SI — FUNDAMENTALLY BETTER”. Industrial laboratory. Diagnostics of materials. 2019;85(6):69.